fundamentals of interface chemistry  
measure method of surface tensiometer  
measure mehod of contact angle meter  
measure mehod of spinning drop tensiometer  
References and Applications  
Dictionary and Glossary  
Glossary A-G  
Glossary H-M  
Glossary O-T  
Glossary U-Z  
Video Collection  
  View Products
  contact us
> HOME > measure mehod of contact angle meter >References for theory of KINO's contact angle meter
References for theory of KINO's contact angle meter

[1] Young T. Philos Trans R Soc Lond; 95, 65, (1905)

[2] Wilhelmy, L. (1863). Ann. Physik., 119, 177.(1863)

[3] E.L.Decker and S.Garoff, using vibrational noise to probe energy barriers producing contact angle hysteresis, Langmuir 12,2100-2110 (1996)

[4] C.Andrieu,C.Sykes and F.Brochard, average spreading parameter on heterogenous surfaces, Langmuir 10, 2077-2080 (1994)

[5] Emil chibowski, Konrad Terpilowski, IN: K.L.Mittal editors. Contact angle, wettability and adhesion Vol 6.Leiden, Boston,VSP, (2009)

[6] R.N.Wenzel, Resistance of solid surface to wetting by water, Ind. Eng. Chem.28,988-994,(1936)

[7] A.B.D.Cassie, Contact angles, Disc. Faraday Soc. 3, 11-16, (1948)

[8] A.B.D.Cassie and S.Baxter, Wettability of porous surfaces, Trans. Faraday Soc. 40,546-551, (1944).

[9] Laplace PS. Traité de Mécanique Céleste, Supplement to Book 10, Gauthier–Villars, Paris, (1805).

[10] G.Quincke, Ann. Phys. Chem. Reihe 4,15, 1 (1858)

[11] J.M. andreas, E.A.Hauser and W.B.Tucker, Boundary tension by pendant drop, J.Phys. Chem., 42 , 1001 ,(1938)

[12] Bashforth F, Adams JC. An attempt to test the theory of capillary action; 1892. Cambridge.

[13] Blaisdell BE. J Math Phys 1940;19:186.

[14] Tawde NR, Parvatikar KG. Indian J Phys 1958;32:174.

[15] Fordham S. Proc R Soc Lond 1948;194A:1.

[16] Mills OS. Br J Appl Phys 1953;4:24.

[17] Paddy JF. In:Matijevic E, editor. Surface Tension. Part II. The Measurement of Surface Tension, vol.1. New York: Wiley; 1968.

[18] Hartland S, Hartley RW. Axisymmetric fluid–liquid interfaces. Amsterdam: Elsevier; 1976.

[19] Malcolm JD, Paynter HM. J Colloid Interface Sci 1981;82:269.

[20] Maze C, Burnet G. Surf Sci 1969;13:451.

[21] Maze C, Burnet G. Surf Sci 1971;24:335.

[22] Huh C, Reed RL. J Colloid Interface Sci 1983;91:472.

[23] Boyce JF, Schürch S, Rotenberg Y, Neumann AW. Colloids Surf 1984;9:307.

[24] M.D.Misak, J.Colloid interface Sci., 27,141, (1968).

[25] D.Winkel, J.Phys.,Chem., 69,348,(1965)

[26] S.Ramakrishnan, J.F.Princz and S.Hartland, indian J. Pure Appl. Phys, 15, 228, (1977)

[27] H.H.J.Girault, D.J.schiffrin, and B.D.V.Smith, The measurement of interfacial tension of pendant drops using a video image profile digitizer, J. Colloid and interface science, Vol.101, 257-266, (1984)

[28] S. H. Anastasiadis, J.K. CHEN, J. T. Koberstein, A. F. Siegel, J. E. Sohn, And J. A. Emerson, The determination of Iinterfacial tension by video Image processing of pendant fluid drops, J. colloid and interface science, Vol.119,55-66,(1986)

[29] F. K. Hansen, G. Rodsrud, Surface tension by pendant drop I. a fast standard instrument using computer image analysis, J. colloid and interface science, Vol. 141,1-9,(1991).

[30] F. K. Hansen, Surface tension by image analysis: fast and automatic measurements of pendant drop and sessile drops and bubbles, J. colloid and interface science, Vol. 160,209-217,(1993).

[31] Fordham, s., Proc. R. Soc. London A 194,1 (1948)

[32] Bihai Song, Jurgen Springer, Determination of interfacial tension from the profile of a pendant drop using computer-aided image processing, J. colloid and interface science 184, 64-76, (1996)

[33] Anastasiadis SH, Chen JK, Koberstein JT, Siegel AP, Sohn JE, Emerson JA. J Colloid Interface Sci 1986;119:55.

[34] Hoggs RV. An introduction to robust estimation.NewYork: Academic Press; 1979.

[35] Cheng P. Automation of Axisymmetric Drop Shape Analysis Using Digital Image Processing. Ph.D. Thesis, University of Toronto, Toronto, 1990.

[36] del Río OI. On the Generalization of Axisymmetric Drop Shape Analysis, M.A.Sc. Thesis, University of Toronto, Toronto, 1993.

[37] Aurélien F. Stalder, Tobias Melchior, Michael Müller, Daniel Sage, Thierry Blu, Michael Unser, Low-bond axisymmetric drop shape analysis for surface tension and contact angle measurements of sessile drops, Colloids and surfaces A: physicochemical and engineering aspects, 16436-16446,(2010)

[38] Nicolas J. Alvarez , Lynn M. Walker, Shelley L. Anna, A non-gradient based algorithm for the determination of surface tension from a pendant drop: Application to low Bond number drop shapes, Journal of Colloid and Interface Science 333, 557–562, (2009)

[39] RotenbergY, Boruvka L, NeumannAW. J Colloid Interface Sci 1983;93:169.

[40] Cheng P, Li D, Boruvka L, Rotenberg Y, Neumann AW. Colloids Surf 1990;43:151.

[41] Cheng P, Neumann AW. Colloids Surf 1992;62:297.

[42] Lahooti S, del Río OI, Cheng P, Neumann AW. In: Neumann AW, Spelt JK, editors. Axisymmetric Drop Shape Analysis (ADSA). New York: Marcel Dekker Inc.; 1996. Chapter 10.

[43] del Río OI, Neumann AW. J Colloid Interface Sci 1997;196:136.

[44] D. Berthelot, Compt. Rend. 126, 1898, (1857)

[45] D.Y. Kwok, A.W. Neumann, Adv. Coll. Inter. Sci. 81, 167, (1999).

[46] G. Antonow, J. Chem. Phys. 5,. 372, (1907)

[47] W. Thompson, Proc. R. SOC. (London) 9,255 (1858).

[48] W. Thompson, Phil. Mag. 17, 61 (1858).

[49] J. W. Gibbs, Collected Works, Vol. 1. Longmans Green, New York, NY (1928).

[50] W. A. Zisman, in: Contact Angle, Wettability and Adhesion, Adv. Chem. Ser. No. 43, p. 1. American Chemical Society, Washington, DC (1964).

and H.W. Fox, A.W. Zisman, J. Coll. Sci. 7 ,109, (1952)

[51] F.M. Fowkes, Contact angle wettability and adhesion, Advances in Chemistry series 43, American Chemical Society, Los Angeles, (1964)

[52] L.A. Girifalco, R.J. Good, J. Phys. Chem. 61, 904, (1957)

[53] D. Y. Kwok and A. W. Neumann, in: Acid-Base Interactions: Relevance to Adhesion Science

[54] D. Li and A. W. Neumann, J. Colloid Me?$ Sci. 148, 190 (1992).

[55] D. Li, M. Xe and A. W. Neumann, Colloid Polym. Sci. 271,573 (1993).

[56] D. Y. Kwok and A. W. Neumann, Colloids SurfacesA 89, 181 (1994).

[57] C. A. Ward and A. W. Neumann, J. Colloid Me?$ Sci. 49, 286 (1974).

[58] D. Li, J. Gaydos and A. W. Neumann, Lungmuir 5,293 (1989).

[59] D. Li and A. W. Neumann, Adv. Colloid Inter$ Sci. 49, 147 (1994).

[60] D. Li, E. Moy and A. W. Neumann, Lungmuir6, 885 (1990).

[61] J. Gaydos and A. W. Neumann, Langmuir9, 3327 (1993).

[62] D. Li and A. W. Neumann, Langmuir 9,3728 (1993).

[63] D. Li and A. W. Neumann, J. Colloid Me. Sci. 137, 304 (1990).

[64] R. N. Wenzel, Ind. Eng. Chem. 28, 988 (1936).

[65] A. B. D. Cassie, Trans. Faraday SOC. 40, 546 (1944).

[66] S. Baxter and A. B. D. Cassie, J. Textile Inst. 36,67 (1945).

[67] A. B. D. Cassie, Discuss. Faraday Soc. 3, 11 (1948).

[68] K. Grundke, T. Bogumil, T. Gietzelt, H.-J. Jacobasch, D. Y. Kwok and A. W. Neumann, Progr.

[69] D. Y. Kwokand A. W. Neumann, J. Phys. Chem. B. 104,741 (2000).

[70] D. Y. Kwok, Colloids S u A~ 15 6, 191 (1999).

[71] D. Y. Kwok, D. Li and A. W. Neumann, Langmuir 10, 1323 (1994).

[72] F.M. Fowkes, J. Phys. Chem. 66,382, (1962)

[73] F.M. Fowkes, Ind. Engg. Chem. 56,40, (1964)

[74] F.M. Fowkes, D.C. McCarthy, M.A. Mostafa, J. Coll. Inter. Sci. 78, 200,(1980)

[75] J.Th.G. Overbeek, in: H.R. Kruyt Ed.., Colloid Science, vol. 1, Elsevier, Amsterdam, (1952)

[76] F.M. Fowkes, in: K.L. Mittal Ed.., Physico-chemical Aspects of Polymer Surfaces, vol. 2, Plenum, New York, (1983)

[77] J.H. Lyklema, Fundamentals of Interface and Colloid Science, vol. III, Academic Press, New York, (2000)

[78] Y. Kitazaki, and T. Hate, Surface-Chemical Criteria for Optimum Adhesion J. Adhesion 4, 123 (1972).

[79] D.K. Owens, R.C. Wendt, J. Appl. Pol. Sci. 13, 1714,(1969)

[80] D.H. Kaelble, Physical Chemistry of Adhesion, Wiely-Interscience, New York, (1971)

[81] S. Wu, J. Polym. Sci. C34,19, (1971)

[82] S. Wu, Polymer Interface and Adhesion, Marcel Dekker, New York, (1982)

[33] C.J. van Oss, R.J. Good, M.K. Chaudhury, The role of van der Waals forces and hydrogen bonds in “hydrophobic interactions” between biopolymers and low energy surfaces, Journal of Colloid and Interface Science 111,378-390., (1986)

[84] C.J. van Oss, M.K. Chaudhury, R.J. Good, Interfacial Lifshitz-van der Waals and polar interactions in macroscopic systems, Chemical Review 88, 927-940, (1988)

[85] M. Zenkiewicz, J. Czuprynska, Chossen problems of radiation modyfication of polymer materials, WAB, Bydgoszcz, 2003, 127-130 (in Polish).

[86] M. Zenkiewicz, Analysis of main aims of van Ossa-Chaudhury’ego-Gooda methods in the investigations of References READING DIRECT: ww.journalamme.org145 Materials surface layer of polymers materials, Polymers 51,169-176 (in Polish), (2006)

[87] Jacques Schultz and Michel Nardin, Determination of the surface energy of solids by the two-liquid-phase method, In: Modern approaches to wettalility- theory and applications, Malcolm E. Schrader and George I.Loeb, (Editor), Plenum press, NewYork, (1992)

[88] Jacques Schultz, Kazuo Tsutsumi and Jean-Baptiste Donnet, Surface Properties of High-Energy Solids I. Determination of the Dispersive Component of the Surface Free Energy of Mica and Its Energy of Adhesion to Water and n-Alkanes, Journal of Colloid and Interface Science, Vol. 59,272-276,(1977)

[89] Jacques Schultz, Kazuo Tsutsumi and Jean-Baptiste Donnet, Surface Properties of High-Energy Solids Determination of the Nondispersive Component of the Surface Free Energy of Mica and Its Energy of Adhesion to Polar Liquids

, Journal of Colloid and Interface Science, Vol. 59,277-282,(1977)

[90] E.Chibowski, Adv., Colloid Interface Sci. 133, 51 (2007)

[91] E.Chibowski, In: contact angle,wettability and adhesion, Vol.2,K.Mittal (Ed.), PP.265-288,VPS,Utrecht (2002)

[92] E.Chibowski, Adv., Colloid Interface Sci. 103, 149 (2003)

[93] E.Chibowski, Adv., Colloid Interface Sci. 113, 121 (2005)

[94]E.Chibowski, R. Perea-Carpio, A. Ontiveros-Ortega, J. Adhesion Sci. Technol. 16,1283, (2002)

[95] C.W. Extrand, J. Colloid Interface Sci. 207, 11, (1998)

[96] L.M. Lander, L.M. Siewierski, W.J. Brittain, E.A. Vogler, Langmuir 9 , 2237, (1993)

[97] J. Ho¨pken, M. Mo¨ller, Macromolecules 25, 1461, (1992)

[98] C. Della Volpe, A. Deimichel, T. Ricco, J. Adhesion Sci. Technol. 12,1141, (1998)

[99] C.N.C. Lam, N. Kim, D. Hui, D.Y. Kwok, M.L. Hair, A.W. Neumann, Colloids Surf. A 189, 265, (2001)

[100] C.N.C. Lam, R. Wu, D. Li, M.L. Hair, A.W. Neumann, Adv. Colloid Interface Sci. 96,169, (2002)

[101] E.Chibowski, In: contact angle,wettability and adhesion, Vol.6,K.Mittal (Ed.), PP.283-299,VPS,Utrecht (2009)

[102] Jhu.D, Luo.X, Shi.L, Science Technology and Engineering, Vol. 7, No. 19, 4997-5004,(2007)

[103]Barton, A. F.M, CRCHandbook of Solubility Parameters and Other Cohesion Parameters, 2nd edition. CRC Press, Boca Raton, FL, Chapters 1 and 2, (1991)

[104] Patton, T. C., Paint Flow and Pigment Dispersion, 2nd edition. Wiley-Inter science, New York, (1979)

[105] R.Tadmor, Langmuir 20, 7659, (2004)

[106] R.Tadmor and P.S.Yadav, J. Colloid interface Sci.,317, 241, (2008)

[107 A.W. Adamson, A.P. Gast, Physical Chemistry of Surfaces, Wiley, New York, (1997)

[108] J.N. Israelachvili, Intermolecular and Surface Forces, Academic Press, London, (1991)

[109] S.A. Safran, Statistical Thermodynamics of Surfaces, Interfaces, and Membranes, Addison–Wesley, Reading, MA, (1994)

[110] A.I. Milchev, A.A. Milchev, Europhys. Lett. 56 (2001) 695.

[111] R. Tadmor, Langmuir 20 (2004) 7659.

[112] B.A. Pethica, J. Colloid Interface Sci. 62 (1977).

[113] R.D. Gretz, J. Chem. Phys. 45 (1966) 3160.

[114] R.D. Gretz, Surf. Sci. 5 (1966) 239.

[115] L. Boruvka, A.W. Neumann, J. Chem. Phys. 66 (1977) 5464.

Further reading books


[1] Adamson, A.W. and Gast, A.P. (1997). Physical Chemistry of Surfaces, 6th edn. Wiley, New York.

[2] Lyklema, J. (2000). Fundamentals of Interface and Colloid Science, III, Liquid–Fluid Interfaces. Academic Press, San Diego.

[3]A.W.Neumann (1996). Applied surface thermodynamics. Marcel Dekker, NewYork.

[4] A.W.Neumann (2011). Applied surface thermodynamics. CRC press, NewYork.





Hot keywords of USA KINO:
contact anglecontact angle measurement,  contact angle meter,  contact angle goniometer,  surface tensiometer, interfacial tensiometer,  surface tension measurement,  surface tension, surface tensiometry, contact angle measurement equipment and device, calculating surfac free energy, Determining Critical Micelle Concentration (CMC) of surfactant, made in China


Home / News / Products / Articles / Downloads / About USA KINO / Feedback / Jobs / Contact USA KINO

Copy Right(C)2005-2014 USA KINO Industry Co., LTD. All rights reserved. Sitemap
Follow US: youtube of USA KINO facebook of USA KINO

Link: KINO China, USA KINO

KeyWords of USA KINO: we are the manufacturer of surface tensiometer which is used to measurement of surface tension or surface tension of liquid/ and supplier of contact angle meter also named as contact angle goniometer for measurement of contact angle or contact angle between liquid-solid and expert of interfacial tensiometer which is used to measure interface tension interfacial tension by pendant drop method, sessile drop method, Wilhelmy plate method ,DuNouy Ring method and spinning drop method